TP200 Compact module changing strain-gauge probe

TP200The TP200 system components are:

  • TP200 or TP200B probe body (the TP200B is a variant with increased vibration tolerance)
  • TP200 stylus module - choice of fixed overtravel forces: SF (standard force) or LF (low force)
  • PI 200 probe interface
  • SCR200 stylus changing rack

There is also an EO module (extended overtravel) which has the same overtravel force as the SF but provides increased operating range and protection in the probe Z axis.

 
Compatibility

Features and benefits
  • Strain-gauge technology offers excellent repeatability and precision 3D form measurement.
  • Zero reseat errors.
  • No lobing effect.
  • 6-way measuring capability
  • Stylus reach of up to 100 mm (GF styli)
  • Rapid probe module changing without the need to re-qualify the stylus tips
  • Life of >10 million triggers

TP200 / TP200B probe body

TP200TP200The TP200 probe uses micro strain gauge transducers to deliver excellent repeatability and accurate 3D form measurement even with long styli.

The sensor technology gives sub-micron repeatability and eliminates the lobing characteristics encountered with kinematic probes. The solid state ASIC electronics within the probe ensure reliable operation over millions of trigger points.

The TP200B uses the same technology as TP200 but has been designed to have higher tolerance to vibration. This helps to overcome the problem of 'air' trigger generation which can arise from vibrations transmitted through the CMM or when using long styli with faster positioning speeds.

Please note that we do not recommend the use of TP200B with the LF module or cranked/star styli.


Specifications
Summary TP200 TP200B

Principal application

DCC CMM where high accuracy is required. As TP200 but where 'air' trigger events occur.

Sense directions

6-axis: ±X, ±Y, ±Z 6-axis: ±X, ±Y, ±Z

Unidirectional repeatability (2s µm)

Trigger level 1: 0.40 µm (0.000016 in)

Trigger level 2: 0.50 µm (0.00002 in)

Trigger level 1: 0.40 µm (0.000016 in)

Trigger level 2: 0.50 µm (0.00002 in)

XY (2D) form measurement deviation

Trigger level 1: ±0.80 µm (0.000032 in)
Trigger level 2: ±0.90 µm (0.000036 in)
Trigger level 1: ±1 µm (0.00004 in)
Trigger level 2: ±1.2 µm (0.000047 in)

XYZ (3D) form measurement deviation

Trigger level 1: ±1 µm (0.00004 in)
Trigger level 2: ±1.40 µm (0.000056 in)
Trigger level 1: ±2.50 µm (0.0001 in)
Trigger level 2: ±4 µm (0.00016 in)
Repeatability of stylus change With SCR200: ±0.50 µm (0.00002 in) max.
Manual: ±1 µm (0.00004 in) max.
With SCR200: ±0.50 µm (0.00002 in) max.
Manual: ±1 µm (0.00004 in) max.
Trigger force (at stylus tip) XY plane (all modules): 0.02 N
Z axis (all modules): 0.07 N
XY plane (all modules): 0.02 N
Z axis (all modules): 0.07 N
Overtravel force (@ 0.50 mm displacement)

XY plane (SF/EO module): 0.2 N to 0.4 N
XY plane (LF module): 0.1 N to 0.15 N
Z axis (SF/EO module): 4.90 N
Z axis (LF module): 1.60 N

XY plane (SF/EO module): 0.2 N to 0.4 N
XY plane (LF module): 0.1 N to 0.15 N
Z axis (SF/EO module): 4.90 N
Z axis (LF module): 1.60 N

Weight (probe sensor and module) 22 g (0.78 oz) 22 g (0.78 oz)
Maximum extension (if on a PH10 series head) 300 mm (11.81 in) 300 mm (11.81 in)
Maximum recommended stylus length (M2 styli range) SF/EO module: 50 mm (1.97 in) steel to 100 mm (3.94 in) GF

LF module: 20 mm (0.79 in) steel to 50 mm (1.97 in) GF

SF/EO module: 50 mm (1.97 in) steel to 100 mm (3.94 in) GF

LF module: 20 mm (0.79 in) steel to 50 mm (1.97 in) GF

Mounting method M8 thread M8 thread
Suitable interface PI200, UCC PI200, UCC

Stylus module changing rack

Automatic: SCR200
Manual: MSR1

Automatic: SCR200
Manual: MSR1

Stylus range M2 M2
 
Probe Modules
Module Application Comments
SF - Standard force   General use Styli up to 100 mm long and ball diameter > 1 mm.
LF - Low force   Small diameter stylus balls or where minimum force is essential Balls less than 1 mm diameter.
EO - Extended overtravel   Extra overtravel to enable the CMM to stop safely from higher probing speeds Same overtravel force as SF. Extra 8 mm of overtravel in probe Z axis.